The VTS Program Committee invites original, unpublished paper submissions for VTS 2016. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, and e-mail address of the contact author. A 50-word abstract and five keywords identifying the topic area are also required.
Proposals for the Innovative Practices and Special Sessions tracks are also invited. The innovative practices track highlights cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them. Special sessions can include panels, embedded tutorials, or hot topic presentations. Innovative practices and special session track proposals should include a title, name and contact information of the session organizer(s), a 150-to-200 word abstract, and a list of prospective participants.
VTS TOPICS
04月25日
2016
04月27日
2016
注册截止日期
2024年04月22日 美国 Tempe
2024 IEEE 42nd VLSI Test Symposium2023年04月23日 美国 San Diego
2023 IEEE 41st VLSI Test Symposium2021年04月25日
2021 IEEE 39th VLSI Test Symposium2019年04月23日 美国
2019 IEEE 37th VLSI Test Symposium2018年04月22日 美国
2018 IEEE 36th VLSI Test Symposium2017年04月09日 美国 Las Vegas, Nevada, USA
2017 35th IEEE VLSI Test Symposium2014年04月13日 美国
2014第32届IEEE VLSI测试研讨会2013年04月29日 美国
2013 IEEE 31st VLSI Test Symposium
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