活动简介

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics and new trends in the area of electronic-based circuits and system testing. In 2013 ETS will take place in the Congress Center of the Popes’ Palace in the beautiful city of Avignon, France

征稿信息

征稿范围

You are invited to participate and submit contributions to ETS'13. The areas of interest include (but are not limited to) the following topics. Analog Test ATE Hardware and Software Automatic Test Generation Board Test and Diagnosis Boundary Scan Test Bu
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重要日期

  • 会议日期

    05月27日

    2013

    至

    05月30日

    2013

  • 05月30日 2013

    注册截止日期

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