Original papers are solicited presenting new developments in topics relevant to ICMTS, including but not limited to, test structures, measurements, and results, in the following areas:

• Design

o Methodologies, verification
o Within-die circuits for process characterization/monitoring
o Design enablement – Characterization and validation of digital and analog libraries

• Measurement techniques

o DC, AC and RF measurements: setup, test and analysis
o Reliability test - including thermal stability, failure analysis etc.
o Statistical analysis, variability, throughput increase, smart test strategies
o Use of machine learning and AI in analysis of data sets - parameter extraction etc.
o Wafer probing, within-die measurements, in-line metrology
o Throughput, testing strategies, yield enhancement and process control tests

• Applications

o Emerging memory technologies (single cell, arrays, and application in neural networks)
o Emerging transistor technologies for digital/analog/power applications
o Photonic devices - silicon integration, new displays (OLED, µ-displays)
o Flexible electronics and sensors (organic and inorganic materials)
o M(N)EMS, actuators, sensors, PV cells and other emerging device