The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield, reliability and security of microelectronic circuits and systems.
The 2021 edition of VTS will be an online virtual interactive live event.
The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions and Innovative Practices sessions.
Sponsor Type:1; 3
General Co-Chairs:
Lorena Anghel
University of Grenoble-Alpes/PHELMA
Stefano Di Carlo
Politecnico di Torino
Program Co-Chairs:
Mehdi Tahoori
Karlsruhe Institute of Technology
Suriyaprakash Natarajan
Intel
Past Chair:
Amit Majumdar
Xilinx
Vice General Co-Chair:
Peilin Song
IBM Research
Vice Program Co-Chair:
Sule Ozev
Arizona State University
Innovative Practices Co-Chair:
Arani Sinha
Intel
Marc Hutner
Teradyne
Special Sessions Co-Chairs:
Naghmeh Karimi
University of Maryland, Baltimore County
Gurgen Harutyunyan
Synopsys
Huawei Li
Chinese Academy of Sciences
New Initiatives Co-Chairs:
Xiaowei Li
Chinese Accademy of Science
New Topics Co-Chairs:
Bernard Courtois
BC Consulting
Bozena Kaminska
Simon Fraser University
Finance Chair:
Chintan Patel
Univ. of Maryland Baltimore County
Registration Chair:
Ke Huang
San Diego State University
Publications Co-Chairs:
avatarmaleAlberto Bosio
Ecole Centrale de Lyon
Kanad Basu
UT Dallas
Media Co-Chairs:
Alessandro Savino
Politecnico di Torino
Marcello Traiola
Ecole Centrale de Lyon
Ex-Officio:
Yervant Zorian
Synopsys
Student Activities Chair:
Ujjwal Guin
Auburn University
Analog, Mixed-Signal, RF Test
ATPG & Compression
Silicon Debug
Automotive Test & Safety
Built-In Self-Test (BIST)
Defect & Current Based Test
Defect & Fault Tolerance
Delay & Performance Test
Design for Testability, Yield or Reliability
Pre-silicon Design Verification & Validation
Post-silicon Validation
Embedded System & Board Test
Embedded Test Methods
Emerging Technologies Test and Reliability
FPGA Test
Fault Modeling and Simulation
Hardware Security
Low-Power IC Test
Machine Learning in Test,Yield and Reliability
Microsystems/MEMS/Sensors Test
Memory Test and Repair
On-Line Test & Error Correction
Power & Thermal Issues in Test
System-on-Chip (SOC) Test
Test & Reliability of Biomedical Devices
Test & Reliability of High-Speed I/O
Test & Reliability of Machine Learning Systems
Test Quality & Reliability
Test Standards & Economics
Test Resource Partitioning
Transient & Soft Errors
2.5D, 3D & SiP Test
Yield Optimization
04月25日
2021
04月28日
2021
摘要截稿日期
注册截止日期
2024年04月22日 美国 Tempe
2024 IEEE 42nd VLSI Test Symposium2023年04月23日 美国 San Diego
2023 IEEE 41st VLSI Test Symposium2019年04月23日 美国
2019 IEEE 37th VLSI Test Symposium2018年04月22日 美国
2018 IEEE 36th VLSI Test Symposium2017年04月09日 美国 Las Vegas, Nevada, USA
2017 35th IEEE VLSI Test Symposium2016年04月25日 美国 Las Vegas, NV, USA
2016年第34届IEEE VLSI测试研讨会2014年04月13日 美国
2014第32届IEEE VLSI测试研讨会2013年04月29日 美国
2013 IEEE 31st VLSI Test Symposium
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