The growing complexity and shrinking geometries of modern manufacturing technologies are making devices increasingly susceptible to the influences of electrical noise, process variation, transistor aging, and the effects of natural radiation. The system-level impact of these errors can be far-reaching, both in safety-critical aerospace and automotive applications and also for large scale servers and high performance applications. 

The SELSE workshop provides a unique forum for discussion of current research and practice in system-level error management. SELSE solicits papers that address the system-level effects of errors from a variety of perspectives: architectural, logical, circuit-level, and semiconductor processes. Case studies in real-world contexts are also welcome.

We are happy to announce that the best papers presented at SELSE will be selected for inclusion in the “Best of SELSE” session at IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2021. These papers will be selected based on the importance of the topic, technical contributions, quality of results, and authors’ agreement to travel to present at DSN in Taipei, Taiwan on June 21 – June 24, 2021.

Sponsor Type:1